Anti-electromigration of lead-free Ag/Frit modified address electrodes in PDPs

Digest of Technical Papers - SID International Symposium

Volumn 39, Issue 1, 2008, Pages 190-193

  Kim, Chul Hong ^a   Jeong, Hyun Mi ^a   Heo, Eun Gi ^a   Lee, Byung Hak ^a   Yu, Byoung Youl ^a   Lee, Byung Chul ^b   Kim, Hyun Don ^b   Kweon, Tae Jong ^b  

^a Samsung SDI   (South Korea)

^b Cheil Industries Inc   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRODES; SILVER;

COST COMPETITIVENESS; ELECTRODE MATERIAL; LOSS OF PERFORMANCE; LUMINOUS EFFICACY; MIGRATION PROPERTIES; PATTERNING PROCESS; PLASMA DISPLAY PANEL; WEIGHT RATIOS;

PLASMA DISPLAY DEVICES;

EID: 55149119979     PISSN: 0097966X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1889/1.3069561     Document Type: Conference Paper

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