메뉴 건너뛰기




Volumn 47, Issue 7 PART 1, 2008, Pages 5330-5332

Transmission electron microscopy characterization of position-controlled InN nanocolumns

Author keywords

CBED; Dislocation; ECR MBE; GaN; InN; Nanocolumn; Polarity; RF MBE; TEM

Indexed keywords

CRYSTAL GROWTH; CYCLOTRONS; DIFFRACTION; DISLOCATIONS (CRYSTALS); ELECTRON CYCLOTRON RESONANCE; ELECTRON DIFFRACTION; ELECTRON MICROSCOPES; GALLIUM ALLOYS; GALLIUM NITRIDE; LANTHANUM COMPOUNDS; MICROSCOPIC EXAMINATION; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; MOLECULAR DYNAMICS; POSITION CONTROL; SEMICONDUCTING GALLIUM; SEMICONDUCTOR QUANTUM WIRES; TRANSMISSION ELECTRON MICROSCOPY;

EID: 55149111417     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.47.5330     Document Type: Article
Times cited : (20)

References (9)
  • 6
    • 55149118808 scopus 로고    scopus 로고
    • T. Araki, T. Yamaguchi, S. Harui, T. Tamiya, H. Miyake, K. Hiramatsu, and Y. Nanishi: in preparation for publication.
    • T. Araki, T. Yamaguchi, S. Harui, T. Tamiya, H. Miyake, K. Hiramatsu, and Y. Nanishi: in preparation for publication.
  • 7
    • 55149117412 scopus 로고    scopus 로고
    • T. Yamaguchi, T. Araki, H. Naoi, and Y. Nanishi: Mater. Res. Soc. Symp. Proc. 955 (2007) 0955-I07-40.
    • T. Yamaguchi, T. Araki, H. Naoi, and Y. Nanishi: Mater. Res. Soc. Symp. Proc. 955 (2007) 0955-I07-40.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.