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Volumn 47, Issue 7 PART 1, 2008, Pages 5330-5332
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Transmission electron microscopy characterization of position-controlled InN nanocolumns
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Author keywords
CBED; Dislocation; ECR MBE; GaN; InN; Nanocolumn; Polarity; RF MBE; TEM
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Indexed keywords
CRYSTAL GROWTH;
CYCLOTRONS;
DIFFRACTION;
DISLOCATIONS (CRYSTALS);
ELECTRON CYCLOTRON RESONANCE;
ELECTRON DIFFRACTION;
ELECTRON MICROSCOPES;
GALLIUM ALLOYS;
GALLIUM NITRIDE;
LANTHANUM COMPOUNDS;
MICROSCOPIC EXAMINATION;
MOLECULAR BEAM EPITAXY;
MOLECULAR BEAMS;
MOLECULAR DYNAMICS;
POSITION CONTROL;
SEMICONDUCTING GALLIUM;
SEMICONDUCTOR QUANTUM WIRES;
TRANSMISSION ELECTRON MICROSCOPY;
CBED;
DISLOCATION;
ECR-MBE;
GAN;
INN;
NANOCOLUMN;
POLARITY;
RF-MBE;
TEM;
ELECTRONS;
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EID: 55149111417
PISSN: 00214922
EISSN: 13474065
Source Type: Journal
DOI: 10.1143/JJAP.47.5330 Document Type: Article |
Times cited : (20)
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References (9)
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