Studies on thermal migration of eu ion doped into TiO2 nanoparticles

Japanese Journal of Applied Physics

Volumn 47, Issue 6 PART 1, 2008, Pages 4651-4657

  Setiawati, Elly ^a   Kawano, Katsuyasu ^a   Tsuboi, Taiju ^b   Seo, Hyo Jin ^c  

^a UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

^b KYOTO SANGYO UNIVERSITY   (Japan)

^c Pukyong National University   (South Korea)

Author keywords

Europium (Eu); Photoluminescence (PL); TiO2; X ray photoelevtron spectroscopy (XPS)

Indexed keywords

COLLOIDS; CRYSTALLITE SIZE; EUROPIUM; GELATION; GELS; IONS; LIGHT EMISSION; LUMINESCENCE; NANOPARTICLES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; PHOTOELECTRON SPECTROSCOPY; PHOTOLUMINESCENCE; SINTERING; SOL-GEL PROCESS; X RAY ANALYSIS;

ATOMIC FORCES; AVERAGE CRYSTALLITE SIZES; CRYSTALLINE STRUCTURES; DIRECT OBSERVATIONS; GEL STATES; HIGH SINTERING TEMPERATURES; PHOTOLUMINESCENCE (PL); PHOTOLUMINESCENCE INTENSITIES; PYROCHLORE STRUCTURES; SINTERING TEMPERATURES; SOL-GEL METHODS; TIO2; X-RAY DIFFRACTIONS; X-RAY PHOTOELECTRON SPECTROSCOPIES; X-RAY PHOTOELEVTRON SPECTROSCOPY (XPS);

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 55049105136     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.47.4651     Document Type: Article

References (42)

1. A. J. Kenyon: Prog. Quantum Electron. 26 (2002) 225.
2. E. D, R. Cruz, L, A. D. Torres, P. Salas, R, A. Rodriquez, and G. A. Kumar: J, Appl. Phys. 94 (2003) 3509.
3. A. Patra: Chern. Phys. Lett. 387 (2004) 35.
4. G. Blasse and B. C. Grabmaier: Luminescence Materials (Springer-Verlag, Berlin, 1994) Chap. 9, p. 186.
5. R. D. Peacock: in Structure and Bonding, ed. J. D. Dunitz (Springer-Verlag, Berlin, 1975) Vol. 22, p. 83.
6. H. You and M. Nogami: J. Phys. Chem. B 108 (2004) 12003.
7. V. Kiisk, I. Sildos, S. Lange, V. Reedo, T. Taate, M. Kirm, and J. Aarik: Appl. Surf. Sci. 247 (2005) 412.
8. V. V. Yakovlev, G. Scarel, C. R. Aita, and S. Mochizuki: Appl. Phys. Lett. 76 (2000) 1107.
9. A. Peng, E. Xie, C. Jia, R. Jiang, and H. Lin: Mater. Lett. 59 (2005) 3866.
10. J.-G. Li, X. Wang, K. Watanabe, and T. Ishigaki: I. Phys. Chem. B 110 (2006) 1121.
11. S. S. Yi, J. S. Bae, B. K. Moon, J. H. Jeong, and J. H. Kim: Opt. Mater. 28 (2006) 610.
12. Q. G. Zeng, Z. J. Ding, and Z. M. Zhang: J. Lumin. 118 (2006) 301.
13. J. Ovenstone, P. J. Titler, R. Withnall, and J. Silver: J. Phys. Chem. B 105 (2001) 7170.
14. J. Ovenstone, P. J. Titler, R. Withnall, and J. Silver: J. Mater. Res. 17 (2002) 2524.
15. Z. W. Quan, L. S. Wang, and J. Lin: Mater. Res. Bull. 40 (2005) 810.
16. G. Hirata, N. Perea, M. Tejeda, J. A. G. Ortega, and J. McKittrick: Opt. Mater. 27 (2005) 1311.
17. Y. Hayashi, H. Narahara, T. Uchida, T. Noguchi, and S. Ibuki: Jpn. J. Appl. Phys. 34 (1995) 1878.
18. K. L. Frindell, M. H. Bartl, M. R. Robinson, G. C. Bazan, A. Poptisch, and G. D. Stucky: J. Solid State Chem. 172 (2003) 81.
19. P. A. M. Berdowski and G. Blasse: J. Solid State Chem. 62 (1986) 317.
20. E. Setiawati, B. C. Hong, T. Murayama, and K. Kawano: Jpn. J. Appl. Phys. 46 (2007) 6290.
21. K. T. Ranjit, H. Cohen, I. Willner, S. Bossmann, and A. M. Braun: J. Catal. 204 (2001) 305.
22. J. Lin and J. Yu: J. Photochem. Photobiol, A 116 (1998) 63.
23. Y. Xie and C. Yuan: Mater. Res. Bull. 39 (2004) 533.
24. Y. Xie, C. Yuan, and X. Li: Appl. Surf. Sci. 221 (2004) 17.
25. A. W. Xu, Y. Gao, and H. Q. Liu: J. Catal. 207 (2002) 151.
26. E. Setiawati and K. Kawano: J. Alloys Compd. 451 (2008) 293.
27. K. Hashimoto, H. Trie, and A. Fujishima: Jpn. J. Appl. Phys. 44 (2005) 8269.
28. K. Hadjiivanov and D. G. Klissurski: Chem. Soc. Rev. 25 (1996) 61.
29. R. C. Weast, M. J. Astle, and W. H. Beyer: CRC Handbook of Chemistry and Physics: A Ready-Reference Book of Chemical and Physical Data (CRC Press, Boca Raton, FL. 2001) 82nd ed., Chap. 12, p. 15.
30. J. N. Lalena and D. A. Cleary: Principles of Inorganic Material Design (John Wiley & Sons, New York, 2005) 1st ed., Chap. 10, p. 335.
31. K. N. P. Kumar, K. Keizer, A. J. Burggraaf, T. Okubo, and H. Nagamoto: J. Mater. Chem. 3 (1993) 1151.
32. R. W. M. Kwok: XPS PEAK Analysis Program, Department of Chemistry, the Chinese University of Hong Kong, Shatin, Hong Kong, distributed as freeware.
33. D. Briggs and M. P. Seah: Practical Surface Analysis (John Wiley & Sons, Chichester, U.K., 1990) 2nd ed., Appnd. 2, p. 541 and Chap. 4, p. 142.
34. Y. Djaoued, R. Bruning, D. Bersani, P. P. Lottici, and S. Badilescu: Mater. Lett. 58 (2004) 2618.
35. Y. Hu, H. L. Tsai, and C. L. Huang: Mater. Sci. Eng. A 344 (2003) 209.
36. H. Zhang and F. Bandfield: J. Mater. Chem. 8 (1998) 2073.
37. W. Gopel, J. A. Anderson, D. Frankel, M. Jaehning, K. Phillips, J. A. Shafer, and G. Rocker: Surf. Sci. 139 (1984) 333.
38. A. Orendorz, J. Wüsten, C. Ziegler, and H. Gnaser; Appl. Surf. Sci. 252 (2005) 85.
39. J. Pouilleau, D. Devilliers, H. Groult, and P. Marcus: J. Mater. Sci. 32 (1997) 5645.
40. P. M. Kumar, S. Badrinarayanan, and M. Sastry: Thin Solid Films 358 (2000) 122.
41. H. Idriss, K. S. Kirn, and M. A. Barteau: Surf. Sci. 262 (1992) 113.
42. J. F. Herbst, J. M. Burkstrand, and J. W. Wilkins: Phys. Rev. B 22 (1980) 531.