Harsh environments: Space radiation environment, effects, and mitigation

Johns Hopkins APL Technical Digest (Applied Physics Laboratory)

Volumn 28, Issue 1, 2008, Pages 17-29

  Maurer, Richard H ^a   Fraeman, Martin E ^a   Martin, Mark N ^a   Roth, David R ^a  

^a APL's Space Department

Author keywords

[No Author keywords available]

Indexed keywords

ABRUPT CHANGES; CUMULATIVE EFFECTS; GRADUAL CHANGES; HARSH ENVIRONMENTS; OPERATIONAL PARAMETERS; SINGLE-EVENT EFFECTS; SPACE RADIATION ENVIRONMENTS; SPACE SYSTEMS; SYSTEM OPERATIONS; TRANSIENT BEHAVIORS;

COSMOLOGY; IONIZING RADIATION; MICROELECTRONICS; SILICON; SOLAR SYSTEM;

RADIATION EFFECTS;

EID: 55049088844     PISSN: 02705214     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (2)

1. Robbins, M. S., "High-Energy Proton-Induced Dark Signal in Silicon Charge Coupled Devices," IEEE Trans. Nucl. Sci. 47, 2473-2479 (2000).
2. Wang, J. J., RTSX72SU-D1N8A1 TID Test Report, Actel Corporation, Mountain View, CA, No. 05T-RTSX72SU-D1N8A1, http://www.actel.com/documents/ RTSX72SU-D1N8A1-r1.pdf (21 Sept 2005).