Hybrid organic/ZnO p-n junctions with n-type ZnO grown by atomic layer deposition

Acta Physica Polonica A

Volumn 114, Issue 5, 2008, Pages 1229-1234

  Luka G ^a   Krajewski, T ^a   Wachnicki, L ^a,b   Szczepanik, A ^a,b   Fldelus, J D ^c   Szczerbakow, A ^a   Lusakowska E ^a   Kopalko, K ^a   Guziewicz, E ^a   Godlewski, M ^a,b  

^a INSTITUTE OF PHYSICS   (Poland)

^b CARDINAL STEFAN WYSZY SKI UNIVERSITY   (Poland)

^c INSTITUTE OF HIGH PRESSURE PHYSICS   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC LAYER DEPOSITION; CARBON; CARBON FILMS; CARBON NANOTUBES; DEPOSITION; DIAMOND FILMS; SEMICONDUCTING ORGANIC COMPOUNDS; SEMICONDUCTOR JUNCTIONS; THIN FILMS; YARN; ZINC OXIDE;

APPLIED VOLTAGES; CHARGING EFFECT; ELECTRICAL MEASUREMENT; ORGANIC MEMORY; ORGANIC THIN FILMS; P-N JUNCTION; POLYCRYSTALLINE ZINC OXIDES; THIN ORGANIC FILMS;

OXIDE FILMS;

EID: 54949114003     PISSN: 05874246     EISSN: None     Source Type: Journal    
DOI: 10.12693/APhysPolA.114.1229     Document Type: Conference Paper

References (6)

1. I.A. Kowalik, E. Guziewicz, K. Kopalko, S. Yatsunenko, M. Godlewski, A. Wójcik, V. Osinniy, T. Krajewski, T. Story, E. Łusakowska, W. Paszkowicz, Acta Phys. Pol. A 112, 401 (2007).
2. E. Guziewicz, I.A. Kowalik, M. Godlewski, K. Kopalko, V. Osinniy, A. Wójcik, S. Yatsunenko, E. Lusakowska, W. Paszkowicz, M. Guziewicz, J. Appl. Phys. 103, 033515 (2008).
3. T. Ruekes, K. Kim, E. Joselevitch, G.Y. Tseng, C. Cheung, C.M. Lieber, Science 289, 5476 (2000).
4. B. Stadlober, V. Satzinger, H. Maresch, D. Somitsch, A. Haase, H. Pichler, W. Rom, G. Jakopic, Proc. SPIE 5217, 112 (2003).
5. D.M. Taylor, C.A. Mills, J. Appl. Phys. 90, 306 (2001).
6. H. Riel, W. Brütting, T. Beierlein, E. Haskal, P. Müller, W. Rieβ, Synthetic Metals 111-112, 303 (2000).