Rietveld texture analysis from diffraction images

Zeitschrift fur Kristallographie, Supplement

Volumn 1, Issue 26, 2007, Pages 125-130

  Lutterotti, L ^a   Bortolotti, M ^a   Ischia, G ^a   Lonardelli, I ^b   Wenk, H R ^b  

^a UNIVERSITY OF TRENTO   (Italy)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

CCD; Image plate; Rietveld refinement; Texture; X ray diffraction

Indexed keywords

EID: 54849442788     PISSN: 0930486X     EISSN: None     Source Type: Journal    
DOI: 10.1524/zksu.2007.2007.suppl_26.125     Document Type: Conference Paper

References (6)

1. Lonardelli, I., Wenk, H. -R., Lutterotti, L. & Goodwin, M., 2005, J. Synchrotron Rad., 12 [3], 354.
2. Ischia, G., Wenk, H. -R., Lutterotti, L. & Berberich, F., 2005, J. Appl. Cryst., 38, 377.
3. Maud: Materials Analysis Using Diffraction, Version 2.0, 2006, http://www.ing.unitn.it/~maud.
4. Lutterotti L., Bortolotti M. & Fambri L., 2005, Acta Crystallographica, A61, C391.
5. Matthies, S., Vinel, G.W. & Helming, K., 1987, Standard Distributions in Texture Analysis (Berlin: Akademie Verlag).
6. Lutterotti, L., Matthies, S., Wenk, H.-R., Schultz, A. S. & Richardson, J.W.Jr, 1997, J. Appl. Phys., 81, 594.