Influence of Alq 3 and/or Al 2O 3 layers at the C 60/aluminum interface on the I-V characteristics of CuPc/C 60-based solar cells

Physica Status Solidi (A) Applications and Materials Science

Volumn 205, Issue 5, 2008, Pages 1226-1232

  Morsli, M ^a   Berredjem, Y ^a,b   Drici, A ^b   Kouskoussa, B ^c   Boulmokh, A ^b   Bernede J C ^a  

^a UNIVERSITÉ DE NANTES   (France)

^b BADJI MOKHTAR UNIVERSITY   (Algeria)

^c UNIVERSITY OF ORAN   (Algeria)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM INTERFACES; CELL PERFORMANCES; CIRCUIT VOLTAGES; CURRENT FLOWS; DIRECT CONTACTS; ELECTRICAL PROPERTIES; FORWARD BIASSED; HYDROXYQUINOLINE; LOW FIELDS; ORGANIC SOLAR CELLS; P-N JUNCTIONS; SHUNT RESISTANCES;

ALUMINA; ALUMINUM; COPPER; CYTOLOGY; ELECTRIC PROPERTIES; EXCITONS; PHOTOVOLTAIC CELLS; SEMICONDUCTOR JUNCTIONS; SOLAR CELLS; SOLAR ENERGY; SOLAR EQUIPMENT; THICK FILMS;

CELLS;

EID: 54849428786     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200723680     Document Type: Article

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