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Volumn 48, Issue 1, 2009, Pages 114-121

Heat conduction in a symmetric body subjected to a current flow of symmetric input and output

Author keywords

Electro thermal problem; Heat conduction; Joule heating; Symmetric body

Indexed keywords

FLUXES; HEAT FLUX; HEAT PROBLEMS; HEATING; HEATING EQUIPMENT; JOULE HEATING; KETONES; OPTICAL FILTERS; THERMOANALYSIS; VECTORS;

EID: 54849419319     PISSN: 12900729     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijthermalsci.2008.03.005     Document Type: Article
Times cited : (19)

References (11)
  • 1
    • 0003053355 scopus 로고
    • Electrical conduction in solids. II. Theory of temperature-dependent conductors
    • Greenwood J.A., and Williamson J.B.P. Electrical conduction in solids. II. Theory of temperature-dependent conductors. Proc. Roy. Soc. Lond. A 246 1244 (1958) 13-31
    • (1958) Proc. Roy. Soc. Lond. A , vol.246 , Issue.1244 , pp. 13-31
    • Greenwood, J.A.1    Williamson, J.B.P.2
  • 3
    • 0035246797 scopus 로고    scopus 로고
    • Crystallization of silicon thin films by current-induced Joule heating
    • Sameshima T., and Ozaki K. Crystallization of silicon thin films by current-induced Joule heating. Thin Solid Films 383 1-2 (2001) 107-109
    • (2001) Thin Solid Films , vol.383 , Issue.1-2 , pp. 107-109
    • Sameshima, T.1    Ozaki, K.2
  • 4
    • 49749201891 scopus 로고
    • Current-induced marker motion in gold wires
    • Huntington H.B., and Grone A.R. Current-induced marker motion in gold wires. J. Phys. Chem. Solids 20 1-2 (1961) 76-87
    • (1961) J. Phys. Chem. Solids , vol.20 , Issue.1-2 , pp. 76-87
    • Huntington, H.B.1    Grone, A.R.2
  • 5
    • 0016940795 scopus 로고
    • Electromigration in thin aluminum films on titanium nitride
    • Blech I.A. Electromigration in thin aluminum films on titanium nitride. J. Appl. Phys. 47 4 (1976) 1203-1208
    • (1976) J. Appl. Phys. , vol.47 , Issue.4 , pp. 1203-1208
    • Blech, I.A.1
  • 6
    • 0035545598 scopus 로고    scopus 로고
    • Electromigration subjected to Joule heating under pulsed DC stress
    • Wu W., Yuan J.S., Kang S.H., and Oates A.S. Electromigration subjected to Joule heating under pulsed DC stress. Solid-State Electron. 45 12 (2001) 2051-2056
    • (2001) Solid-State Electron. , vol.45 , Issue.12 , pp. 2051-2056
    • Wu, W.1    Yuan, J.S.2    Kang, S.H.3    Oates, A.S.4
  • 7
    • 33745257588 scopus 로고    scopus 로고
    • Electromigration failure of metal lines
    • Abé H., Sasagawa K., and Saka M. Electromigration failure of metal lines. Int. J. Fract. 138 1-4 (2006) 219-240
    • (2006) Int. J. Fract. , vol.138 , Issue.1-4 , pp. 219-240
    • Abé, H.1    Sasagawa, K.2    Saka, M.3
  • 8
    • 29144504068 scopus 로고    scopus 로고
    • Formation of metallic nanowires by utilizing electromigration
    • Saka M., and Ueda R. Formation of metallic nanowires by utilizing electromigration. J. Mater. Res. 20 10 (2005) 2712-2718
    • (2005) J. Mater. Res. , vol.20 , Issue.10 , pp. 2712-2718
    • Saka, M.1    Ueda, R.2
  • 9
    • 0026727501 scopus 로고
    • Path-independent integrals for heat conduction analysis in electrothermal crack problems
    • Saka M., and Abé H. Path-independent integrals for heat conduction analysis in electrothermal crack problems. J. Thermal Stresses 15 1 (1992) 71-83
    • (1992) J. Thermal Stresses , vol.15 , Issue.1 , pp. 71-83
    • Saka, M.1    Abé, H.2
  • 10
    • 58149209837 scopus 로고
    • Current density and temperature distributions near the corner of angled metal line
    • Sasagawa K., Saka M., and Abé H. Current density and temperature distributions near the corner of angled metal line. Mechanics Research Comm. 22 5 (1995) 473-483
    • (1995) Mechanics Research Comm. , vol.22 , Issue.5 , pp. 473-483
    • Sasagawa, K.1    Saka, M.2    Abé, H.3
  • 11
    • 54849412297 scopus 로고    scopus 로고
    • A.B. COMSOL, COMSOL Multiphysics User's Guide, Version 3.2, Stockholm, Sweden, 2005
    • A.B. COMSOL, COMSOL Multiphysics User's Guide, Version 3.2, Stockholm, Sweden, 2005


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.