Defect structure examination of Sn-doped indium oxide (ITO)

Zeitschrift fur Kristallographie, Supplement

Volumn 2, Issue 26, 2007, Pages 489-494

  Popovic J ^a   Tkalcec E ^b   Grzeta B ^a   Goebbert, C ^c   Ksenofontov, V ^d   Takeda, M ^e  

^a RUDER BO KOVI INSTITUTE   (Croatia)

^b UNIVERSITY OF ZAGREB   (Croatia)

^c R and D Nanocomp   (Germany)

^d JOHANNES GUTENBERG UNIVERSITY   (Germany)

^e TOHO UNIVERSITY   (Japan)

Author keywords

Fitting methods; Indium tin oxide (ITO); M ssbauer spectroscopy; Rietveld method; X Ray powder diffraction

Indexed keywords

EID: 54849414521     PISSN: 0930486X     EISSN: None     Source Type: Journal    
DOI: 10.1524/zksu.2007.2007.suppl_26.489     Document Type: Conference Paper

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