|
Volumn 44, Issue 22, 2008, Pages 1289-1291
|
CMOS-based programmable gate ISFET
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ION SENSITIVE FIELD EFFECT TRANSISTORS;
LOGIC GATES;
CAPACITIVELY COUPLED;
CHEMICAL SENSING;
CMOS PROCESSES;
DEVICE MISMATCHES;
FLOATING GATES;
GATE VOLTAGES;
INVERSION OPERATIONS;
LOW-POWER;
OPERATING POINTS;
PROGRAMMABLE GATES;
TRAPPED CHARGES;
TUNABILITY;
FIELD EFFECT TRANSISTORS;
|
EID: 54849411304
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el:20082268 Document Type: Article |
Times cited : (55)
|
References (5)
|