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Volumn 104, Issue 6, 2008, Pages

Reliability study of tunable ferroelectric capacitors

Author keywords

[No Author keywords available]

Indexed keywords


EID: 54749139301     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2978353     Document Type: Article
Times cited : (3)

References (14)
  • 10
    • 48349108822 scopus 로고    scopus 로고
    • Proceedings of the 37th European Microwave Conference (EuMC), (unpublished)
    • A. V. Tumarkin, S. V. Razumov, A. G. Gagarin, M. M. Gaidukov, and A. B. Kozyrev, Proceedings of the 37th European Microwave Conference (EuMC), 2007 (unpublished), pp. 1275-8.
    • (2007) , pp. 1275-8
    • Tumarkin, A.V.1    Razumov, S.V.2    Gagarin, A.G.3    Gaidukov, M.M.4    Kozyrev, A.B.5
  • 11
    • 54749106937 scopus 로고    scopus 로고
    • 2005 IEEE MTT-S International Microwave Symposium (IEEE, New York), Vol., CD-ROM, Catalog No. 05CH37620C.
    • O. Tageman, S. Gevorgian, D. Iddles, P. Filhol, V. O. Sherman, A. K. Tagantsev, and L. Carlsson, 2005 IEEE MTT-S International Microwave Symposium (IEEE, New York, 2005), Vol. 4, CD-ROM, Catalog No. 05CH37620C.
    • (2005) , vol.4
    • Tageman, O.1    Gevorgian, S.2    Iddles, D.3    Filhol, P.4    Sherman, V.O.5    Tagantsev, A.K.6    Carlsson, L.7
  • 13
    • 54749153145 scopus 로고    scopus 로고
    • U.S. Patent No. 6.998.851 B2 (pending).
    • W. M. Van Spengen, U.S. Patent No. 6.998.851 B2 (pending).
    • Van Spengen, W.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.