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Review of Scientific Instruments

Volumn 79, Issue 9, 2008, Pages

An automated submicron beam profiler for characterization of high numerical aperture optics

(4) Chapmana, J J a Norton, B G a Streed, E W a Kielpinski, D a

a GRIFFITH UNIVERSITY (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 54749115623 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.2991112 Document Type: Article

Times cited : (7)

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