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Volumn 39, Issue 3, 2008, Pages 1227-1230

Distinguished student paper: Noble a-Si:H gate driver with high stability

Author keywords

[No Author keywords available]

Indexed keywords

THIN FILM TRANSISTORS; THRESHOLD VOLTAGE;

EID: 54549117978     PISSN: 0097966X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1889/1.3069358     Document Type: Conference Paper
Times cited : (37)

References (9)
  • 1
    • 33244483387 scopus 로고    scopus 로고
    • Level Shifter Embedded in Drive Circuits with Amorphous Silicon TFTs
    • B. S. Bae, J. W Choi, J. H. Oh, and J. Jang, "Level Shifter Embedded in Drive Circuits with Amorphous Silicon TFTs", IEEE Trans. Electron Dev., Vol. 52, pp. 494, 2006
    • (2006) IEEE Trans. Electron Dev , vol.52 , pp. 494
    • Bae, B.S.1    Choi, J.W.2    Oh, J.H.3    Jang, J.4
  • 2
    • 33644512393 scopus 로고    scopus 로고
    • Stability of DC-DC converter using Hydrogenated amorphous Thin Film Transistors
    • J. W. Choi, J. H. Oh, S. H. Kim, J. H. Hur, B. S. Bae, and J. Jang, "Stability of DC-DC converter using Hydrogenated amorphous Thin Film Transistors", J. Korean Phys. Soc, Vol. 48, pp. S98, 2006
    • (2006) J. Korean Phys. Soc , vol.48
    • Choi, J.W.1    Oh, J.H.2    Kim, S.H.3    Hur, J.H.4    Bae, B.S.5    Jang, J.6
  • 5
    • 32444449978 scopus 로고    scopus 로고
    • Stability of an Amorphous Silicon Oscillator
    • B. S. Bae, J. W. Choi, J. H. Oh, K. M. Kim, and J Jang, "Stability of an Amorphous Silicon Oscillator", J. ETRI, Vol. 28, pp. 45, 2006
    • (2006) J. ETRI , vol.28 , pp. 45
    • Bae, B.S.1    Choi, J.W.2    Oh, J.H.3    Kim, K.M.4    Jang, J.5
  • 7
    • 21544438388 scopus 로고
    • Charge Trapping Instabilities in Amorphous Silicon-Silicon Nitride Thin-Film Transistors
    • M. J. Powel, "Charge Trapping Instabilities in Amorphous Silicon-Silicon Nitride Thin-Film Transistors", Appl. Phys. Lett., Vol. 43, pp. 597, 1983
    • (1983) Appl. Phys. Lett , vol.43 , pp. 597
    • Powel, M.J.1
  • 8
    • 36549092941 scopus 로고
    • Time and Temperature Dependence of Instability Mechanisms in Amorphous Silicon Thin-Film Transistors
    • M. J. Powel, C. van Berkel, and J. R. Hughes, "Time and Temperature Dependence of Instability Mechanisms in Amorphous Silicon Thin-Film Transistors", Appl. Phys. Lett., Vol. 54, pp. 1323, 1989
    • (1989) Appl. Phys. Lett , vol.54 , pp. 1323
    • Powel, M.J.1    van Berkel, C.2    Hughes, J.R.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.