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Volumn 24, Issue 19, 2008, Pages 11307-11312

Scanning white-light interferometry as a novel technique to quantify the surface roughness of micron-sized particles for inhalation

Author keywords

[No Author keywords available]

Indexed keywords

AEROSOLS; AIR POLLUTION; ATOMIC FORCE MICROSCOPY; BODY FLUIDS; CURING; DEWATERING; DRYING; ELECTROMAGNETIC WAVES; FRICTION; INTERFEROMETERS; INTERFEROMETRY; LIGHT; METAL ANALYSIS; MICROSCOPIC EXAMINATION; PARTICLE SIZE ANALYSIS; PHOTORESISTS; PROFILOMETRY; SCANNING; SECONDARY EMISSION; SPRAY DRYING; SUGARS; SURFACE PROPERTIES; SURFACE ROUGHNESS;

EID: 54549084457     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la8016062     Document Type: Article
Times cited : (25)

References (32)
  • 19
    • 54549087023 scopus 로고    scopus 로고
    • The Role of Particle Morphology in Powder Inhalers
    • Paris
    • Chan, H.-K. The Role of Particle Morphology in Powder Inhalers. In ROD Europe 2007; ROD Online: Paris, 2007; pp 187-196.
    • (2007) ROD Europe 2007; ROD Online , pp. 187-196
    • Chan, H.-K.1
  • 31
    • 56349085578 scopus 로고    scopus 로고
    • Optical Surface Profilometry of Low Reflectance Materials-Evaluation as a Laser Processing Diagnostic
    • Brandt, M, Harvey, E, Eds, Laser Institute of America: Orlando, FL
    • Joyce, A. M.; Kane, D. M.; Chater, R. J. Optical Surface Profilometry of Low Reflectance Materials-Evaluation as a Laser Processing Diagnostic. In Proceedings of the Second Pacific International Conference on Application of Lasers and Optics; Brandt, M., Harvey, E. , Eds.; Laser Institute of America: Orlando, FL, 2006.
    • (2006) Proceedings of the Second Pacific International Conference on Application of Lasers and Optics
    • Joyce, A.M.1    Kane, D.M.2    Chater, R.J.3
  • 32
    • 54549084836 scopus 로고    scopus 로고
    • Method for profiling an object surface using a large equivalent wavelength and system therefore
    • U.S. Patent 5,598,265
    • de Groot, P. Method for profiling an object surface using a large equivalent wavelength and system therefore. U.S. Patent 5,598,265, 1997.
    • (1997)
    • de Groot, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.