A 2-40 GHz probe station based setup for on-wafer antenna measurements

IEEE Transactions on Antennas and Propagation

Volumn 56, Issue 10, 2008, Pages 3241-3247

  Van Caekenberghe, Koen ^a,b   Brakora, Kenneth M ^a,c   Hong, Wonbin ^a   Jumani, Karan ^a,d   Liao, DaHan ^a   Rangwala, Mustafa ^a   Wee, Yun Zhen ^a,d   Zhu, Xinen ^a   Sarabandi, Kamal ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

^b Thaler Air Systems   (Netherlands)

^c USAF   (United States)

^d MOTOROLA INC   (United States)

Author keywords

Aperture coupled microstrip antenna; Electrically short antenna; On wafer antenna measurements; Probe station

Indexed keywords

ANTENNA ARRAYS; COPLANAR WAVEGUIDES; DIRECTIONAL PATTERNS (ANTENNA); ELECTRONIC EQUIPMENT TESTING; MEASUREMENT ERRORS; MICROSTRIP ANTENNAS; MICROWAVE ANTENNAS; SLOT ANTENNAS; WAVEGUIDES;

ANTENNA MEASUREMENTS; ANTENNA UNDER TESTS; APERTURE COUPLED MICROSTRIP ANTENNA; APERTURE COUPLED MICROSTRIP ANTENNAS; COAXIAL CONNECTORS; DYNAMIC RANGES; ELECTRICALLY SHORT ANTENNA; EMBEDDING; FORWARD SCATTERINGS; MEASURED DATUM; MICROWAVE PROBES; ON-WAFER ANTENNA MEASUREMENTS; PROBE STATION; PROBE STATIONS; RADIATION PATTERNS; RETURN LOSSES; TEST FIXTURES; TRANSCEIVER IC; WAFER DICING; WAVEGUIDE FLANGES;

ANTENNAS;

EID: 54349127844     PISSN: 0018926X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TAP.2008.929433     Document Type: Article

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