Spectroscopic ultrahigh-resolution full-field optical coherence microscopy

Optics Express

Volumn 16, Issue 21, 2008, Pages 17082-17091

  Dubois, Arnaud ^a   Moreau, Julien ^a   Boccara, Claude ^b  

^a UNIV PARIS SUD   (France)

^b PSL RESEARCH UNIVERSITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER ANALYSIS; TOMOGRAPHY;

ABSORPTION MEASUREMENTS; ILLUMINATION SOURCES; INTERFEROMETRIC IMAGES; OPTICAL COHERENCE MICROSCOPY; SHORT TIME FOURIER ANALYSIS; SPECTROSCOPIC IMAGING; SPECTROSCOPIC INFORMATION; ULTRAHIGH RESOLUTION;

IMAGE RESOLUTION;

ARTICLE; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; EQUIPMENT; EQUIPMENT DESIGN; IMAGE ENHANCEMENT; INSTRUMENTATION; LIGHT; MICROSCOPY; OPTICAL COHERENCE TOMOGRAPHY; RADIATION SCATTERING; SENSITIVITY AND SPECIFICITY; SPECTROSCOPY; THEORETICAL MODEL;

COMPUTER SIMULATION; COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; LIGHT; MICROSCOPY; MODELS, THEORETICAL; SCATTERING, RADIATION; SENSITIVITY AND SPECIFICITY; SPECTRUM ANALYSIS; TOMOGRAPHY, OPTICAL COHERENCE;

EID: 54249142605     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.017082     Document Type: Article

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