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Volumn 47, Issue 1 PART 2, 2008, Pages 492-495
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Molecular orientation and electromagnetic properties of perhydrogenated and perfluorinated copper phthalocyanine thin films
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Author keywords
Copper phthalocyanine; Electron spin resonance; Organic thin film transistor; Perfluorinated copper phthalocyanine; X ray diffraction
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Indexed keywords
ANGLE MEASUREMENT;
CHEMICAL SENSORS;
CIVIL AVIATION;
COPPER;
DIFFRACTION;
ELECTRON SPIN RESONANCE SPECTROSCOPY;
ELECTROSLAG REMELTING;
HEAT CONDUCTION;
MOLECULAR ORIENTATION;
SEMICONDUCTING ORGANIC COMPOUNDS;
SOLIDS;
SPIN DYNAMICS;
THICK FILMS;
THIN FILM DEVICES;
THIN FILM TRANSISTORS;
THIN FILMS;
X RAY ANALYSIS;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
ACCUMULATION MODES;
ANGULAR VARIATIONS;
CHAIN INTERACTIONS;
CHANNEL LAYERS;
COPPER PHTHALOCYANINE;
COPPER PHTHALOCYANINE (CUPC);
COPPER PHTHALOCYANINES;
CUPC FILMS;
DEVIATION ANGLES;
ELECTROMAGNETIC PROPERTIES;
ELECTRON SPIN RESONANCE;
LATTICE PLANES;
LATTICE SPACINGS;
LINE POSITIONS;
LINE-WIDTHS;
ON/OFF RATIOS;
ORGANIC;
ORGANIC THIN-FILM TRANSISTOR;
PERFLUORINATED;
PERFLUORINATED COPPER PHTHALOCYANINE;
TILT ANGLES;
X-RAY DIFFRACTIONS;
XRD PATTERNS;
ELECTROMAGNETIC WAVES;
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EID: 54249109517
PISSN: 00214922
EISSN: 13474065
Source Type: Journal
DOI: 10.1143/JJAP.47.492 Document Type: Article |
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Times cited : (4)
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References (10)
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