Sensitivity of ZnO films doped with Er, Ta and Co to NH 3 at room temperature

Physica Status Solidi (A) Applications and Materials Science

Volumn 205, Issue 8, 2008, Pages 1993-1997

  Dimova Malinovska, D ^a   Nichev, H ^a   Georgieva, V ^b   Angelov, O ^a   Pivin, J C ^c   Mikli, V ^d  

^a BULGARIAN ACADEMY OF SCIENCES   (Bulgaria)

^b INSTITUTE OF SOLID STATE PHYSICS   (Bulgaria)

^c CENTRE DE CALCUL DE L INSTITUT NATIONAL DE PHYSIQUE NUCLEAIRE ET DE PHYSIQUE DES PARTICULES   (France)

^d TALLINN UNIVERSITY OF TECHNOLOGY   (Estonia)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION PROCESSES; AQUEOUS SOLUTION OF AMMONIAS; DOPING ELEMENTS; QUARTZ CRYSTALS; RESONANCE FREQUENCY SHIFTS; ROOM TEMPERATURES; TIME-FREQUENCY; ZNO FILMS;

ADSORPTION; CONCENTRATION (PROCESS); ERBIUM; GAS ADSORPTION; MAGNETRON SPUTTERING; METALLIC FILMS; OXIDE MINERALS; PHOTORESISTS; QUARTZ; QUARTZ CRYSTAL MICROBALANCES; RESONANCE; SEMICONDUCTING ZINC COMPOUNDS; SOLUTIONS; SORPTION; TANTALUM; ZINC ALLOYS; ZINC OXIDE;

COBALT;

EID: 54249084541     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200778887     Document Type: Conference Paper

References (23)

1. D. Dimova-Malinovska, N. Tzenov, N. Tzolov, and L. Vassilev, J. Mater. Sci. Technol. B 52, 59 (1998).
2. Y. Cao, L. Miao, S. Tanemura, M. Tanemura, Y. Kuno, Y. Hayashi, and Y. Mori, Jpn. J. Appl. Phys. 45, 1623 (2006).
3. G. S. T. Rao and D. T. Rao, Sens. Actuators B, Chem. 55, 166 (1999).
4. M. Aslam, V. Chaudhary, I. Mulla, S. Sainkar, B. Mandale, A. Belhekar, and V. Vijayamohanan, Sens. Actuators A 75, 162 (1999).
5. N. Koshizaki, and T. Oyama, Sens. Actuators B, Chem. 66, 119 (2000).
6. T. Kwon, S.-H. Park, J.-Y. Ryu, and H.-H. Choi, Sens. Actuators B, Chem. 46, 75 (1998).
7. X.-H. Wang, Y.-F. Ding, J. Zhang, Z.-Q. Zhu, S.-Z. You, S.-Q. Chen, and J. Zhu, Sens. Actuators B, Chem. 46, 421 (2006).
8. J. Xu, Q. Pan, Y. Shun, and Z. Tian, Sens. Actuators B, Chem. 66, 277 (2000).
9. D. Dimova-Malinovska, H. Nichev, O. Angelov, V. Grigorov, and M. Kamenova, J. Superlattices Microstruct. 42, 123 (2007).
10. V. Lazarova, L. Spassov, V. Georgiev, S. Andreev, E. Manolov, and L. Popova, Vacuum 47, 1423 (1996).
11. A. Kuroyanagi, J. Appl. Phys. 72, 5492 (1989).
12. C.-H. Choi and S. H. Kim, Thin Solid Films 515, 2864 (2007).
13. JCPDS-ICCD, PDF, No 36-0862.
14. B. E. Warren, X-ray Diffraction (Dover Publication Inc., New York, 1990), p. 253.
15. J. Pankove, Optical Processes in Semiconductors (Prentice-Hall, Inc., New Jersey, 1971).
16. D. Dragoman and M. Dragoman, Optical Characterization of Solids (Springer-Verlag, Heidelberg, 2002).
17. H. T. Lin, T. S. Chin, J. C. Shih, S. H. Lin, T. M. Hong, R. T. Huang, F. R. Chen, and J. J. Kai, Appl. Phys. Lett. 85, 621 (2004).
18. T. Fukumura, Z. Jin, K. Hasegawa, M. Kawasaki, P. Ahmet, T. Chikyow, and H. Koinuma, J. Appl. Phys. 90, 4246 (2001).
19. A. Kimura, Y. Ohbuchi, T. Kawahara, Y. Okamoto, and J. Morimoto, Jpn. J. Appl. Phys. 40, 3614 (2001).
20. J. Blasco, F. Bartolome, L. Garcia, and J. Garcia, J. Mater. Chem. 16, 2282 (2006).
21. H. Nichev, O. Angelov, J. C. Pivin, R. Nisumaa, and D. Dimova-Malinovska, J. Phys.: Conf. Ser. (2008) in press.
22. V. Malov, Piezoresonanie datchizi (Enegyatomizdat, Moscow, 1989), p. 68 [in Russian].
23. M. S. Wang, G. H. Jain, D. R. Patil, S. A. Patil, and L. A. Patil, Sens. Actuators B, Chem, 115, 128 (2006).