A comparison of atomic force microscopy (AFM) and dynamic light scattering (DLS) methods to characterize nanoparticle size distributions

Journal of Nanoparticle Research

Volumn 10, Issue SUPPL. 1, 2008, Pages 89-96

  Hoo, Christopher M ^a   Starostin, Natasha ^b,c   West, Paul ^b   Mecartney, Martha L ^a  

^a University of California at Irvine   (United States)

^b Pacific Nanotechnology Inc   (United States)

^c Rosemount Analytical Inc   (United States)

Author keywords

Atomic force microscopy; Dynamic light scattering; Instrumentation; Nanotechnology; Polystyrene nanoparticles; Size analysis

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; DYNAMIC LIGHT SCATTERING; DYNAMIC LOADS; ELECTROMAGNETIC WAVES; IMAGE SEGMENTATION; LIGHT SCATTERING; MICROSCOPIC EXAMINATION; NANOPARTICLES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; POLYMER BLENDS; POLYSTYRENES; REFRACTION; SCATTERING; SIZE DISTRIBUTION;

ACCURATE; ATOMIC FORCES; AUTOMATED ANALYSES; BIMODAL DISTRIBUTIONS; CHARACTERIZATION OF NANOPARTICLES; DISPERSED PARTICLES; DYNAMIC LIGHT; INSTRUMENTATION; MONODISPERSED; NANOPARTICLE CHARACTERIZATIONS; NANOPARTICLE SIZE DISTRIBUTIONS; POLYSTYRENE NANOPARTICLES; RAPID ANALYSES; SIZE ANALYSIS; SIZE RANGES;

SCANNING PROBE MICROSCOPY;

NANOPARTICLE; POLYSTYRENE;

ACCURACY; ARTICLE; ATOMIC FORCE MICROSCOPY; CONTROLLED STUDY; DISPERSION; INTERMETHOD COMPARISON; LIGHT SCATTERING; NANOTECHNOLOGY; PARTICLE SIZE; PRIORITY JOURNAL;

EID: 54249083926     PISSN: 13880764     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11051-008-9435-7     Document Type: Article

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