메뉴 건너뛰기




Volumn 1, Issue 1, 2008, Pages 391-400

Planar multi-reflecting time-of-flight mass analyzer with a jig-saw ion path

Author keywords

Correction of temporal aberrations; Mass spectrometry; Time of flight mass analyzer

Indexed keywords


EID: 54149110590     PISSN: 18753884     EISSN: 18753892     Source Type: Conference Proceeding    
DOI: 10.1016/j.phpro.2008.07.120     Document Type: Conference Paper
Times cited : (37)

References (9)
  • 4
    • 54149085657 scopus 로고    scopus 로고
    • L.M. Nazarenko, L.M. Sekunova and E.M. Yakushev, SU Patent 1725289 A1 (1992).
    • L.M. Nazarenko, L.M. Sekunova and E.M. Yakushev, SU Patent 1725289 A1 (1992).
  • 9
    • 54149106776 scopus 로고    scopus 로고
    • B.N. Kozlov, ASMS 2005 abstract (www.asms.org).
    • B.N. Kozlov, ASMS 2005 abstract (www.asms.org).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.