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Volumn 50, Issue 1, 2005, Pages 73-81

Multireflection planar time-of-flight mass analyzer. I: An analyzer for a parallel tandem spectrometer

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Indexed keywords


EID: 13944252965     PISSN: 10637842     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1854827     Document Type: Article
Times cited : (50)

References (27)
  • 4
    • 13944278316 scopus 로고
    • M. L. Aleksandrov, L. N. Gall', N. V. Krasnov, et al., Dokl. Akad. Nauk SSSR 277, 374 (1984) [Sov. Phys. Dokl. 29, 39 (1984)].
    • (1984) Sov. Phys. Dokl. , vol.29 , pp. 39
  • 13
    • 13944271638 scopus 로고    scopus 로고
    • A. Verentchikov, GB Patent No. 2,390,935 (July 16, 2002)
    • A. Verentchikov, GB Patent No. 2,390,935 (July 16, 2002).
  • 18
    • 13944281618 scopus 로고    scopus 로고
    • D. J. Douglas and J. B. French, US Patent No. 4,963,736 (December 12, 1988)
    • D. J. Douglas and J. B. French, US Patent No. 4,963,736 (December 12, 1988).
  • 21
    • 13944259255 scopus 로고    scopus 로고
    • L. M. Nazarenko, L. Sekunova, and E. M. Yakushev, Patent Appl. No. 1,725,289 A1 (Russia, 1992)
    • L. M. Nazarenko, L. Sekunova, and E. M. Yakushev, Patent Appl. No. 1,725,289 A1 (Russia, 1992).
  • 24
    • 0347144352 scopus 로고
    • Énergoatomizdat, St. Petersburg, [in Russian]
    • G. Vol'nik, Optics of Charged Particles (Énergoatomizdat, St. Petersburg, 1992) [in Russian].
    • (1992) Optics of Charged Particles
    • Vol'nik, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.