Voltammetry of copper oxide micro-particles immobilised on diatomite surface

Journal of Electroanalytical Chemistry

Volumn 623, Issue 1, 2008, Pages 75-80

  Komorsky Lovrić, Šebojka ^a   Marinić Pajc, Ljiljana ^b   Tadej, Neven ^c   Horvat, Alka J M ^d   Petran, Jasenka ^b  

^a RUDER BO KOVI INSTITUTE   (Croatia)

^b INA Industrija Nafte d d   (Croatia)

^c UNIVERSITY OF ZAGREB   (Croatia)

^d UNIVERSITY OF ZAGREB   (Croatia)

Author keywords

Copper oxide; Diatomite; Scanning electron microscopy; Voltammetry of microcrystals; X ray diffraction

Indexed keywords

AGGLOMERATION; COPPER; DIFFRACTION; MICROSCOPIC EXAMINATION; SCANNING; SCANNING ELECTRON MICROSCOPY; SECONDARY EMISSION; SINTERING; STRIPPING (DYES); VOLTAMMETRY; X RAY ANALYSIS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

CHARACTERISATION; DIATOMITE; SINTERING TEMPERATURES; STRIPPING VOLTAMMETRIES; X-RAY DIFFRACTIONS;

COPPER OXIDES;

EID: 54049132441     PISSN: 15726657     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jelechem.2008.06.029     Document Type: Article

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