Physical characterization of CdMnS nanocrystalline thin films grown by vacuum thermal evaporation

Journal of Optoelectronics and Advanced Materials

Volumn 8, Issue 1, 2006, Pages 266-270

  Iacomi, F ^a   Salaoru, I ^a   Apetroaei, N ^a   Vasile, A ^a   Teodorescu, C M ^b   Macovei, D ^b  

^a ALEXANDRU IOAN CUZA UNIVERSITY OF IASI   (Romania)

^b NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

Author keywords

Diluted magnetic semiconductors; Optical properties; Quasi closed volume technique; Structure; Thin films

Indexed keywords

BLUE SHIFT; CADMIUM SULFIDE; DILUTED MAGNETIC SEMICONDUCTORS; ENERGY GAP; II-VI SEMICONDUCTORS; MAGNETIC SEMICONDUCTORS; MOLAR RATIO; NANOCRYSTALLINE MATERIALS; NANOCRYSTALS; OPTICAL PROPERTIES; STRUCTURE (COMPOSITION); TERNARY ALLOYS; THERMAL EVAPORATION; VACUUM EVAPORATION;

EFFECTIVE MASS; NANOCRYSTALLINE THIN FILMS; PHYSICAL CHARACTERIZATION; QUASI-CLOSED VOLUME TECHNIQUE; SILICON SUBSTRATES; STARTING POWDERS; THERMAL EVAPORATION TECHNIQUE; VACUUM THERMAL EVAPORATION;

THIN FILMS;

EID: 33646014173     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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