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Volumn 104, Issue 7, 2008, Pages

High-throughput screening of shape memory alloy thin-film spreads using nanoindentation

(6) Dwivedi, Arpit a Wyrobek, Thomas J a Warren, Oden L a Hattrick Simpers, Jason b Famodu, Olubenga O b Takeuchi, Ichiro b

a Bruker Corporation (United States)

b UNIVERSITY OF MARYLAND (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALLOYING; CHEMICAL ANALYSIS; HARDNESS; MANGANESE; MANGANESE COMPOUNDS; MECHANICAL PROPERTIES; NANOINDENTATION; PHASE DIAGRAMS; SHAPE MEMORY EFFECT; THIN FILM DEVICES;

COMPOSITION SPREADS; FILM LIBRARIES; HARDNESS VALUES; HEUSLER COMPOSITIONS; HIGH-THROUGHPUT SCREENINGS; INDENTATION HARDNESSES; MARTENSITE REGIONS; RAPID CHARACTERIZATIONS; REDUCED ELASTIC MODULUS; SHAPE MEMORY ALLOYS; TERNARY COMPOSITIONS;

ALLOYS;

EID: 54049110396 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.2982091 Document Type: Article

Times cited : (20)

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