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Volumn 76, Issue 6, 2005, Pages
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Investigation of machine compliance uniformity for nanoindentation screening of wafer-supported libraries
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Author keywords
[No Author keywords available]
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Indexed keywords
MACHINE COMPLIANCE UNIFORMITY;
NANOINDENTATION;
TWEEZERS;
VACUUM RINGS;
ATOMIC FORCE MICROSCOPY;
ELASTIC MODULI;
FEEDBACK CONTROL;
HARDNESS;
SILICON WAFERS;
THIN FILMS;
VACUUM;
INDENTATION;
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EID: 12344276274
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1906089 Document Type: Article |
Times cited : (12)
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References (12)
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