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Volumn 60, Issue 1, 2009, Pages 60-63

Theory for very low stress ("Harper-Dorn") creep

Author keywords

Aluminum; Dislocation network; Harper Dorn creep; High temperature creep; Low stress creep

Indexed keywords

NETWORK PROTOCOLS; SENSOR NETWORKS;

EID: 53949085317     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2008.08.033     Document Type: Article
Times cited : (10)

References (17)
  • 3
    • 53949118003 scopus 로고    scopus 로고
    • P. Kumar, M.E. Kassner, W. Blum, P. Eisenlohr, T.G. Langdon, Mater. Sci. Eng. A, in press.
    • P. Kumar, M.E. Kassner, W. Blum, P. Eisenlohr, T.G. Langdon, Mater. Sci. Eng. A, in press.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.