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Volumn 634, Issue 6-7, 2008, Pages 1166-1172

Rietveld analysis and Raman spectroscopic investigations on α-Y 2Si2O7

Author keywords

Y2Si2O7; Polymorphism; Raman spectroscopy; Rietveld analysis; Yttrium disilicate

Indexed keywords


EID: 53849146733     PISSN: 00442313     EISSN: 15213749     Source Type: Journal    
DOI: 10.1002/zaac.200700548     Document Type: Article
Times cited : (39)

References (42)
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  • 28
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    • Springer Verlag, Berlin, Heidelberg, New York, Tokio
    • F. Liebau, Structural chemistry of silicates, Springer Verlag, Berlin - Heidelberg - New York - Tokio 1985, p. 305-307.
    • (1985) Structural chemistry of silicates , pp. 305-307
    • Liebau, F.1
  • 33
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    • E. Dowty, VIBRATZ - Shape Software, Kingsport, USA, 2006.
    • E. Dowty, VIBRATZ - Shape Software, Kingsport, USA, 2006.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.