Adsorption of n-hexane and p-xylene in thin silicalite-1 films studied by FTIR/ATR spectroscopy

Journal of Physical Chemistry C

Volumn 112, Issue 20, 2008, Pages 7717-7724

  Grahn, Mattias ^a   Holmgren, Allan ^a   Hedlund, Jonas ^a  

^a LULEÅ UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ADSORPTION ISOTHERMS; AROMATIC HYDROCARBONS; ATMOSPHERIC TEMPERATURE; CRYSTAL GROWTH; CRYSTALLOGRAPHY; CRYSTALS; FOURIER TRANSFORMS; GRAIN BOUNDARIES; ISOTHERMS; POWDERS; SILICATE MINERALS; XYLENE; ZEOLITES;

ADSORPTION ENTHALPIES; FOURIER; HENRY'S CONSTANTS; LITERATURE DATA; MICRO-PORES; N-HEXANE; P-XYLENE; POLYCRYSTALLINE FILMS; PRESSURE DATA; SATURATION CAPACITIES; SILICALITE-1; SINUSOIDAL CHANNELS; SMALL CRYSTALS; TOTAL REFLECTION;

HEXANE;

EID: 53349175516     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp800345v     Document Type: Article

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