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Volumn 55, Issue 6, 2001, Pages 655-662
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In situ infrared technique for studying adsorption onto particulate silica surfaces from aqueous solutions
a a a |
Author keywords
Aqueous adsorption; ATR; Attenuated total reflection; Silica particles
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Indexed keywords
ADSORPTION;
BINDERS;
PARTICLES (PARTICULATE MATTER);
POLYETHYLENES;
SILANES;
SILICA;
SILICON WAFERS;
SOLUTIONS;
SURFACE TREATMENT;
ZINC COMPOUNDS;
ATTENUATED TOTAL REFLECTION SPECTROSCOPY;
SUCCINIC ANHYDRIDE;
ZINC SELENIDE;
INFRARED SPECTROSCOPY;
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EID: 0035359926
PISSN: 00037028
EISSN: None
Source Type: Journal
DOI: 10.1366/0003702011952505 Document Type: Article |
Times cited : (28)
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References (24)
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