IR-SNOM on lithium fluoride films with regular arrays based on colour centres

Physica Status Solidi C: Conferences

Volumn , Issue 8, 2003, Pages 3075-3080

  Cricenti, A ^a   Longo, G ^a   Mussi, V ^a   Generosi, R ^a   Luce, M ^a   Perfetti, P ^a   Vobornik, D ^b   Margaritondo, G ^b   Thielen, P ^c   Sanghera, J S ^c   Aggarwal, I D ^c   Tolk, N H ^d   Baldacchini, G ^e   Bonfigli, F ^e   Flora, F ^e   Marolo, T ^e   Montereali, R M ^e   Faenov, A ^f   Pikuz, T ^f   Somma, F ^g   Piston, D W ^h   more..

^a CNR   (Italy)

^b EPFL   (Switzerland)

^c NAVAL RESEARCH LABORATORY   (United States)

^d VANDERBILT UNIVERSITY   (United States)

^e ENEA   (Italy)

^f Multicharged Ions Spectra Data Center of VNIIFTRI   (Russian Federation)

^g ROMA TRE UNIVERSITY   (Italy)

^h VANDERBILT UNIVERSITY SCHOOL OF MEDICINE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INFRARED REGIONS; IR-SNOM; LITHIUM FLUORIDE; REGULAR ARRAY; SCANNING NEAR-FIELD OPTICAL MICROSCOPE; SILICON SUBSTRATES; SOFT X-RAY;

REFRACTIVE INDEX;

COLOR CENTERS;

EID: 53349141677     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200303836     Document Type: Conference Paper

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