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Volumn 26, Issue 4, 2008, Pages 387-393
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Anisotropic dewetting on stretched elastomeric substrates
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Author keywords
[No Author keywords available]
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Indexed keywords
ANISOTROPIC DEWETTING;
ELASTOMERIC SUBSTRATES;
LINEAR STABILITY;
MICROSCALE FEATURES;
PATTERNED SURFACES;
POTENTIAL APPLICATIONS;
THIN LIQUID FILMS;
VAN DER WAALS;
LINEAR STABILITY ANALYSIS;
LIQUID FILMS;
VAN DER WAALS FORCES;
SUBSTRATES;
NANOMATERIAL;
ALGORITHM;
ANISOTROPY;
ARTICLE;
CHEMISTRY;
EQUIPMENT DESIGN;
MATERIALS TESTING;
METHODOLOGY;
NANOTECHNOLOGY;
PHYSICS;
STATISTICAL MODEL;
SURFACE PROPERTY;
TENSILE STRENGTH;
ALGORITHMS;
ANISOTROPY;
EQUIPMENT DESIGN;
MATERIALS TESTING;
MODELS, STATISTICAL;
NANOSTRUCTURES;
NANOTECHNOLOGY;
PHYSICS;
SURFACE PROPERTIES;
TENSILE STRENGTH;
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EID: 53349120489
PISSN: 12928941
EISSN: 1292895X
Source Type: Journal
DOI: 10.1140/epje/i2008-10334-3 Document Type: Article |
Times cited : (5)
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References (29)
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