Erratum to "Thin film engineering for N@C60 quantum computers: Spin detection and device patterning approaches" [Solid State Sciences 10 (2008) 1314-1321] (DOI:10.1016/j.solidstatesciences.2007.12.039);Thin film engineering for N@C60 quantum computers: Spin detection and device patterning approaches

Solid State Sciences

Volumn 10, Issue 10, 2008, Pages 1314-1321

  Schaefer, Sebastian ^a,b   Huebener, Kati ^a   Harneit, Wolfgang ^a,b   Boehme, Christoph ^c   Fostiropoulos, Konstantinos ^b   Angermann, Heike ^b   Rappich, Jörg ^b   Behrends, Jan ^b   Lips, Klaus ^b  

^a FREIE UNIVERSITÄT BERLIN   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

^c UNIVERSITY OF UTAH   (United States)

Author keywords

Endohedral fullerenes; Local anodic oxidation; Magnetic resonance; Quantum computing; Self assembly

Indexed keywords

FULLERENES; MAGNETIC RESONANCE; QUANTUM COMPUTERS; SELF ASSEMBLY; TEMPERATURE; THIN FILMS;

ELECTRICALLY DETECTED MAGNETIC RESONANCES; ENDOHEDRAL FULLERENE; FULLERENE STRUCTURE; LOCAL ANODIC OXIDATION; LOW TEMPERATURE METHOD; PARAMAGNETIC STATE; PATTERNING APPROACHES; QUANTUM COMPUTING;

ANODIC OXIDATION;

EID: 53349102074     PISSN: 12932558     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solidstatesciences.2008.11.006     Document Type: Erratum

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