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Volumn 55, Issue 3, 2008, Pages 567-583

An effective defect inspection system for polarized film images using image segmentation and template matching techniques

Author keywords

Defect inspection system; Image segmentation; Polarized film; Template matching

Indexed keywords

DEFECTS; DIGITAL IMAGE STORAGE; FEATURE EXTRACTION; IMAGE ANALYSIS; IMAGE ENHANCEMENT; IMAGE PROCESSING; IMAGE SEGMENTATION; INSPECTION EQUIPMENT; LIGHT SOURCES; LIQUID CRYSTAL DISPLAYS; LIQUID CRYSTALS; TEMPLATE MATCHING; THICK FILMS; THIN FILM DEVICES; THIN FILM TRANSISTORS;

EID: 53249129414     PISSN: 03608352     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cie.2008.01.015     Document Type: Article
Times cited : (32)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.