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Volumn 67, Issue 1, 2008, Pages 32-40
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Spring constants and adhesive properties of native bacterial biofilm cells measured by atomic force microscopy
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Author keywords
Adhesion; AFM; Bacteria; Elasticity; EPS
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Indexed keywords
ADHESION;
ATOMIC FORCE MICROSCOPY;
ATOMIC PHYSICS;
ATOMS;
BACTERIOLOGY;
BIOFILMS;
BIOFILTERS;
CELL MEMBRANES;
CELLS;
ELASTICITY;
MICROSCOPIC EXAMINATION;
MOLECULAR BIOLOGY;
NITRIDES;
POLYSACCHARIDES;
SCANNING PROBE MICROSCOPY;
SILICON;
SILICON NITRIDE;
SPRINGS (COMPONENTS);
STRAIN;
SURFACE CHEMISTRY;
TURBULENT FLOW;
ADHESIVE FORCES;
ADHESIVE PROPERTIES;
AFM;
ATOMIC FORCE;
BACTERIA;
BACTERIAL BIOFILMS;
BACTERIAL STRAINS;
BIOFILM CELLS;
BIOFILM FORMATIONS;
CELL SURFACES;
CELL TYPES;
EPS;
FORCE COMPONENTS;
GLASS SURFACES;
LIPOPOLYSACCHARIDES;
NON-LINEAR REGIMES;
PLANKTONIC CELLS;
POSITIVE CELLS;
SHORTEST DISTANCE;
SPRING CONSTANTS;
CYTOLOGY;
ADHESIVE AGENT;
GLASS;
GLYCERYL TRINITRATE;
LIPOPOLYSACCHARIDE;
SILICON;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
BACTERIAL CELL;
BACTERIAL COLONIZATION;
BACTERIAL STRAIN;
BIOFILM;
CELL SURFACE;
CELL TYPE;
ELASTICITY;
GRAM NEGATIVE SEPSIS;
GRAM POSITIVE BACTERIUM;
MOLECULE;
NONHUMAN;
PHYSICAL CHEMISTRY;
PLANKTON;
PRIORITY JOURNAL;
BACILLUS SUBTILIS;
BACTERIAL ADHESION;
BIOFILMS;
ELASTICITY;
ESCHERICHIA COLI;
MICROCOCCUS LUTEUS;
MICROSCOPY, ATOMIC FORCE;
PSEUDOMONAS PUTIDA;
BACTERIA (MICROORGANISMS);
NEGIBACTERIA;
POSIBACTERIA;
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EID: 53149101620
PISSN: 09277765
EISSN: None
Source Type: Journal
DOI: 10.1016/j.colsurfb.2008.07.021 Document Type: Article |
Times cited : (54)
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References (39)
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