Reliability sampling plans for Weibull distribution with limited capacity of test facility

Computers and Industrial Engineering

Volumn 55, Issue 3, 2008, Pages 721-728

  Tsai, Tzong Ru ^a   Lu, Yu Ting ^b   Wu, Shuo Jye ^a  

^a TAMKANG UNIVERSITY   (Taiwan)

^b NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

Acceptance sampling; Posterior distribution; Prior distribution; Type II censoring; Warranty policy

Indexed keywords

CLUSTER ANALYSIS; PARAMETER ESTIMATION; RANDOM VARIABLES; TEST FACILITIES; TESTING; WEIBULL DISTRIBUTION;

ACCEPTANCE SAMPLING; AVERAGE COST; CENSORED DATA; COST MODELLING; COST PER UNIT; LIFE TESTING; LIFE-TIME DISTRIBUTION; LIMITED CAPACITY; NUMERICA L RESULTS; OPTIMAL RELIABILITY; POSTERIOR DISTRIBUTION; PRIOR DISTRIBUTION; SAMPLING PLANS; SCALE PARAMETERS; SHAPE PARAMETERS; TYPE II; TYPE II CENSORING; WARRANTY POLICIES; WARRANTY POLICY; WEIBULL;

SAMPLING;

EID: 53049089523     PISSN: 03608352     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cie.2008.02.010     Document Type: Article

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