Fidelity, fidelity susceptibility, and von Neumann entropy to characterize the phase diagram of an extended Harper model

Physical Review B - Condensed Matter and Materials Physics

Volumn 78, Issue 11, 2008, Pages

  Gong, Longyan ^a,b   Tong, Peiqing ^a  

^a NANJING NORMAL UNIVERSITY   (China)

^b NANJING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 52949152907     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.78.115114     Document Type: Article

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