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note
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-1): 3110 (s), 3047 (s), 2952 (s), 2915 (s), 2878 (s), 1605 (vs), 1574 (s), 1530 (s), 1391 (s), 1347 (s), 1106 (s), 656 (s).
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22
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52949083591
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note
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2 = 0.0688 for all reflections, 421 parameters, 3 restraints. The data collection was collected on a Rigaku RAXIS-RAPID single-crystal diffractometer with Mo Kα radiation (λ = 0.71073 Å) at 293 K. The structures of 1 and 2 were solved by Direct Method of SHELXS-97 (G.M. Sheldrick, SHELXS-97, Programs for X-ray Crystal Structure Solution, University of Göttingen, Göttingen, Germany, 1997) and refined by full-matrix least-squares techniques using the SHELXL-97 program (G.M. Sheldrick, SHELXL-97, Programs for X-ray Crystal Structure Refinement, University of Göttingen, Göttingen, Germany, 1997).
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52949085128
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note
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2 = 0.2322 for all reflections, 254 parameters, 0 restraints. The data collection was performed at 293 K on a Bruker Apex CCD diffractometer with graphite-monochromated Mo Kα radiation (λ = 0.71073 Å).
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