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Volumn , Issue , 2008, Pages 53-58

A practical fault attack on square and multiply

Author keywords

[No Author keywords available]

Indexed keywords

CRYPTOGRAPHY; ELECTRIC FAULT CURRENTS; FAILURE ANALYSIS; FAULT TOLERANCE; RELIABILITY;

EID: 52949113084     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/FDTC.2008.10     Document Type: Conference Paper
Times cited : (78)

References (13)
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    • F. Bao, R. H. Deng, Y. Han, A. B. Ieng, A. D. Narasimhalu, and T.-H. Ngair. Breaking Public Key Cryptosystems on Tamper Resistant Devices in the Presence of Transient Faults. In B. Christiansen, B. Crispo, T. M. A. Lomas, and M. Roe, editors, Security Protocols, 5th International Workshop, Paris, France, April 7-9, 1997, Proceedings, volume 1361 of Lecture Notes in Computer Science, pages 115-124. Springer, 1998.
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    • M. Boreale. Attacking Right-to-Left Modular Exponentiation with Timely Random Faults. In L. Breveglieri, I. Koren, D. Naccache, and I.-P. Seifert, editors, Fault Diagnosis and Tolerance in Cryptography, Third International Workshop, FDTC 2006, Yokohama, Japan, October 10, 2006, Proceedings, volume 4236 of Lecture Notes in Computer Science, pages 24-35. Springer, October 2006.
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    • Analyzing and Comparing Montgomery Multiplication Algorithms
    • 26-33, lune
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    • M. Joye, J.-S. Quisquater, F. Bao, and R. H. Deng. RSA-type Signatures in the Presence of Transient Faults. In M. Darnell, editor, Cryptography and Coding, 6th IMA International Conference, Cirencester, UK, December 17-19, 1997, Proceedings, 1355 of Lecture Notes in Computer Science, pages 155-160. Springer, 1997.
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    • 84943632039 scopus 로고    scopus 로고
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.