Superresolution along extended depth of focus with binary-phase filters for the Gaussian beam

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 25, Issue 8, 2008, Pages 2095-2101

  Liu, Linbo ^a   Diaz, Frédéric ^b   Wang, Liang ^c   Loiseaux, Brigitte ^b   Huignard, Jean Pierre ^b   Sheppard, C J K ^a   Chen, Nanguang ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b THALES RESEARCH AND TECHNOLOGY   (France)

^c UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVES; GAUSSIAN NOISE (ELECTRONIC); IMAGE ACQUISITION; OPTICAL RESOLVING POWER; TRELLIS CODES; WAVE FILTERS;

AXIAL INTENSITIES; DEBYE REGIMES; DEPTH OF FOCUSSED; DIFFRACTION LIMITS; DOF GAINS; EFFICIENT; EXPERIMENTAL VERIFICATIONS; EXTENDED DEPTH OF FOCUSSED; GAUSSIAN PROFILES; HIGH-RESOLUTION; OPTIMAL FILTER DESIGNS; PARAXIAL; PHASE FILTERS; PUPIL FILTERS; PUPIL PLANES; STREHL RATIOS; SUPERRESOLUTION;

GAUSSIAN BEAMS;

ARTICLE; ARTIFACT; AUTOMATED PATTERN RECOGNITION; LIGHT; MATHEMATICAL COMPUTING; NORMAL DISTRIBUTION; OPTICS; REFRACTOMETRY; STATISTICAL MODEL; THEORETICAL MODEL;

ARTIFACTS; LIGHT; MODELS, STATISTICAL; MODELS, THEORETICAL; NORMAL DISTRIBUTION; NUMERICAL ANALYSIS, COMPUTER-ASSISTED; OPTICS; PATTERN RECOGNITION, AUTOMATED; REFRACTOMETRY;

EID: 52649142083     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.25.002095     Document Type: Article

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