Reliability of next-generation networks with a focus on IMS architecture

Bell Labs Technical Journal

Volumn 12, Issue 4, 2008, Pages 109-125

  Pant, Himanshu ^a,b   Chu, Chi Hung Kelvin ^b,c   Richman, Steven H ^b,d,e   Jrad, Ahmad ^a   O'Reilly, Gerard P ^a  

^a LUCENT TECHNOLOGIES   (United States)

^b IEEE

^c Department of Medecine   (United States)

^d STEVENS INSTITUTE OF TECHNOLOGY   (United States)

^e Institute of Electrical and Electronics Engineers ^*

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC IMPEDANCE MEASUREMENT; FLUORINE COMPOUNDS; MULTIMEDIA SYSTEMS; OUTAGES; POLONIUM COMPOUNDS; RELIABILITY;

DESIGN FOR RELIABILITY; ECONOMIC OPTIMIZATION; ENGINEERING METHODOLOGY; NEXT-GENERATION NETWORKS (NGNS); OPERATING ENVIRONMENT; RELIABILITY ASSESSMENTS; TELEPHONY APPLICATIONS; TRADITIONAL APPROACHES;

NEXT GENERATION NETWORKS;

EID: 52649096432     PISSN: 10897089     EISSN: 15387305     Source Type: Journal    
DOI: 10.1002/bltj.20270     Document Type: Article

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