TSM-AW sensors based on Miller XCOs for microgravimetric measurements in liquid media

IEEE Transactions on Instrumentation and Measurement

Volumn 57, Issue 10, 2008, Pages 2309-2319

  Rodríguez Pardo, Loreto ^a   Rodríguez, José Fariña ^a   Gabrielli, Claude ^b   Perrot, Hubert ^b   Brendel, Remi ^b,c  

^a UNIVERSITY OF VIGO   (Spain)

^b CNRS   (France)

^c Centre National de la Recherche Scientifique   (France)

Author keywords

Design method; Liquid media; Miller crystalcontrolled oscillators (XCOs); Thickness shear mode acousticwave (TSM AW) sensors

Indexed keywords

BIOSENSORS; CRYSTAL OSCILLATORS; DAMPING; ELECTRON TUBES; MOLECULAR BIOLOGY; MOLECULAR RECOGNITION; NETWORKS (CIRCUITS); OSCILLATORS (ELECTRONIC); OXIDE MINERALS; QUARTZ;

CHEMICAL SPECIES; DESIGN METHOD; HIGH RESOLUTIONS; LIQUID MEDIA; LIQUID MEDIUMS; MICROGRAVIMETRIC; MICROGRAVIMETRIC MEASUREMENTS; MILLER CRYSTALCONTROLLED OSCILLATORS (XCOS); QUALITY FACTOR; QUARTZ CRYSTALS; STRONG DAMPING; THICKNESS-SHEAR; THICKNESS-SHEAR-MODE ACOUSTICWAVE (TSM-AW) SENSORS;

SENSORS;

EID: 52649088317     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2008.922104     Document Type: Article

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