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Journal of Electronic Materials

Volumn 25, Issue 11, 1996, Pages 1673-1683

Microstructure and chemistry of Cu-Ge ohmic contact layers to GaAs

(3) Oktyabrsky, S a Aboelfotoh, M O a Narayan, J a

a North Carolina State University (United States)

Author keywords

GaAs; Microstructure; Ohmic contacts; Transmission electron microscopy (TEM)

Indexed keywords

EID: 5244373385 PISSN: 03615235 EISSN: None Source Type: Journal
DOI: 10.1007/s11664-996-0022-3 Document Type: Article

Times cited : (10)

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