Cu3Ge ohmic contacts to n-type GaAs

Journal of Electronic Materials

Volumn 25, Issue 11, 1996, Pages 1662-1672

  Oktyabrsky, S ^a   Aboelfotoh, M O ^a   Narayan, J ^a   Woodall, J M ^b  

^a North Carolina State University   (United States)

^b PURDUE UNIVERSITY   (United States)

Author keywords

Contact resistivity; Cu Ge alloys; GaAs; High resolution transmission electron microscopy (HRTEM); Ohmic contact

Indexed keywords

EID: 5244298924     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-996-0021-4     Document Type: Article

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