SCOPUS 정보 검색 플랫폼

Journal of Applied Physics

Volumn 82, Issue 3, 1997, Pages 1042-1052

Implantation-induced disordering of CuPtB-ordered GaInP

(7) Burkard, M a Englert, A a Geng, C a Muhe A a Scholz, F a Schweizer, H a Phillipp, F b

a UNIVERSITY OF STUTTGART (Germany)

b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 5244261183 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.365869 Document Type: Article

Times cited : (3)

References (36)

1
- 36449004415
- S.-H. Wei, D. B. Laks, and A. Zunger, Appl. Phys. Lett. 62, 1937 (1993).
- (1993) Appl. Phys. Lett. , vol.62 , pp. 1937
- Wei, S.-H.¹ Laks, D.B.² Zunger, A.³

2
- 0001106545
- K. A. Maeder and A. Zunger, Phys. Rev. B 51, 10462 (1995).
- (1995) Phys. Rev. B , vol.51 , pp. 10462
- Maeder, K.A.¹ Zunger, A.²

3
- 51149206925
- A. Gomyo, T. Suzuki, K. Kobayashi, S. Kawata, I. Hino, and T. Yuasa, Appl. Phys. Lett. 50, 673 (1987).
- (1987) Appl. Phys. Lett. , vol.50 , pp. 673
- Gomyo, A.¹ Suzuki, T.² Kobayashi, K.³ Kawata, S.⁴ Hino, I.⁵ Yuasa, T.⁶

4
- 85033161901
- note
- 0.5(1+η)P.

5
- 21544442661
- P. Ernst, C. Geng, F. Scholz, H. Schweizer, Y. Zhang, and A. Mascarenhas, Appl. Phys. Lett. 67, 2347 (1995).
- (1995) Appl. Phys. Lett. , vol.67 , pp. 2347
- Ernst, P.¹ Geng, C.² Scholz, F.³ Schweizer, H.⁴ Zhang, Y.⁵ Mascarenhas, A.⁶

6
- 0001001494
- P. Ernst, C. Geng, F. Scholz, and H. Schweizer, Phys. Status Solidi B 193, 213 (1996).
- (1996) Phys. Status Solidi B , vol.193 , pp. 213
- Ernst, P.¹ Geng, C.² Scholz, F.³ Schweizer, H.⁴

7
- 0025494231
- Y. Ueno, H. Fujii, K. Kobayashi, K. Endo, A. Gomyo, K. Hara, S. Kawata, T. Yuasa, and T. Suzuki, Jpn. J. Appl. Phys. 29, L1666 (1990).
- (1990) Jpn. J. Appl. Phys. , vol.29
- Ueno, Y.¹ Fujii, H.² Kobayashi, K.³ Endo, K.⁴ Gomyo, A.⁵ Hara, K.⁶ Kawata, S.⁷ Yuasa, T.⁸ Suzuki, T.⁹

8
- 0026173292
- K. Itaya, M. Ishikawa, G. Hatakoshi, and Y. Uematsu, IEEE J. Quantum Electron. 27, 1496 (1991).
- (1991) IEEE J. Quantum Electron. , vol.27 , pp. 1496
- Itaya, K.¹ Ishikawa, M.² Hatakoshi, G.³ Uematsu, Y.⁴

9
- 0024104459
- P. Gavrilovic, F. P. Dabkowski, K. Meehan, H. E. Williams, W. Stutius, K. C. Hsieh, N. Holonyak, Jr., M. A. Shahid, and S. Mahajan, J. Cryst. Growth 93, 426 (1988).
- (1988) J. Cryst. Growth , vol.93 , pp. 426
- Gavrilovic, P.¹ Dabkowski, F.P.² Meehan, K.³ Williams, H.E.⁴ Stutius, W.⁵ Hsieh, K.C.⁶ Holonyak Jr., N.⁷ Shahid, M.A.⁸ Mahajan, S.⁹

10
- 0000882802
- S. O'Brien, D. P. Bour, and H. H. Shealy, Appl. Phys. Lett. 53, 1859 (1988).
- (1988) Appl. Phys. Lett. , vol.53 , pp. 1859
- O'Brien, S.¹ Bour, D.P.² Shealy, H.H.³

11
- 0029255618
- H. Hommel, B. Höhing, C. Geng, M. Kessler, D. Haase, F. Scholz, and H. Schweizer, Microelectron. Eng. 27, 445 (1995).
- (1995) Microelectron. Eng. , vol.27 , pp. 445
- Hommel, H.¹ Höhing, B.² Geng, C.³ Kessler, M.⁴ Haase, D.⁵ Scholz, F.⁶ Schweizer, H.⁷

12
- 0004719679
- Y. Hämisch, H. Steffen, A. Forchel, and P. Röntgen, Appl. Phys. Lett. 62, 3007 (1993).
- (1993) Appl. Phys. Lett. , vol.62 , pp. 3007
- Hämisch, Y.¹ Steffen, H.² Forchel, A.³ Röntgen, P.⁴

13
- 0343311230
- Y. Hämisch, H. Steffen, H. Oshinowo, A. Forchel, and P. Röntgen, J. Vac. Sci. Technol. B 10, 2864 (1992).
- (1992) J. Vac. Sci. Technol. B , vol.10 , pp. 2864
- Hämisch, Y.¹ Steffen, H.² Oshinowo, H.³ Forchel, A.⁴ Röntgen, P.⁵

14
- 5244354958
- M. Burkard, A. Englert, C. Geng, F. Scholz, and H. Schweizer, Mater. Res. Soc. Symp. Proc. 417, 67 (1995).
- (1995) Mater. Res. Soc. Symp. Proc. , vol.417 , pp. 67
- Burkard, M.¹ Englert, A.² Geng, C.³ Scholz, F.⁴ Schweizer, H.⁵

15
- 3342995345
- Y. Hämisch, H. Steffen, P. Röntgen, and A. Forchel, Jpn. J. Appl. Phys. 32, L1492 (1993).
- (1993) Jpn. J. Appl. Phys. , vol.32
- Hämisch, Y.¹ Steffen, H.² Röntgen, P.³ Forchel, A.⁴

16
- 0026172355
- C. S. Baxter, W. M. Stobbs,and H. H. Wilkie, J. Cryst. Growth 112, 373 (1991).
- (1991) J. Cryst. Growth , vol.112 , pp. 373
- Baxter, C.S.¹ Stobbs, W.M.² Wilkie, H.H.³

17
- 0001432466
- S. H. Kurtz, H. M. Olson, D. H. Arent, M. H. Bode, and K. A. Bertness, J. Appl. Phys. 75, 5110 (1994).
- (1994) J. Appl. Phys. , vol.75 , pp. 5110
- Kurtz, S.H.¹ Olson, H.M.² Arent, D.H.³ Bode, M.H.⁴ Bertness, K.A.⁵

18
- 36549096940
- P. Bellon, H. P. Chevalier, E. Augarde, H. P. André, and G. P. Martin, J. Appl. Phys. 66, 2388 (1989).
- (1989) J. Appl. Phys. , vol.66 , pp. 2388
- Bellon, P.¹ Chevalier, H.P.² Augarde, E.³ André, H.P.⁴ Martin, G.P.⁵

19
- 0030105725
- P. Ernst, C. Geng, G. Hahn, F. Scholz, H. Schweizer, F. Phillipp, and A. Mascarenhas, J. Appl. Phys. 79, 2633 (1996).
- (1996) J. Appl. Phys. , vol.79 , pp. 2633
- Ernst, P.¹ Geng, C.² Hahn, G.³ Scholz, F.⁴ Schweizer, H.⁵ Phillipp, F.⁶ Mascarenhas, A.⁷

20
- 0642359416
- to be published
- G. Hahn, C. Geng, P. Ernst, H. Schweizer, F. Scholz, and F. Phillipp, Superlattices Microstruct. (to be published).
- Superlattices Microstruct.
- Hahn, G.¹ Geng, C.² Ernst, P.³ Schweizer, H.⁴ Scholz, F.⁵ Phillipp, F.⁶

21
- 21544479510
- F. E. Prins, G. Lehr, M. Burkard, H. Schweizer, M. H. Pilkuhn, and G. W. Smith, Appl. Phys. Lett. 62, 1365 (1993).
- (1993) Appl. Phys. Lett. , vol.62 , pp. 1365
- Prins, F.E.¹ Lehr, G.² Burkard, M.³ Schweizer, H.⁴ Pilkuhn, M.H.⁵ Smith, G.W.⁶

22
- 0345488604
- N. Noda and S. Takeda, Phys. Rev. B 53, 7197 (1996).
- (1996) Phys. Rev. B , vol.53 , pp. 7197
- Noda, N.¹ Takeda, S.²

23
- 0003598030
- Butterworths, London
- P. Hirsch, A. Howie, H. Nicholson, D. W. Pashley, and M. H. Whelan, Electron Microscopy of Thin Crystals (Butterworths, London, 1967).
- (1967) Electron Microscopy of Thin Crystals
- Hirsch, P.¹ Howie, A.² Nicholson, H.³ Pashley, D.W.⁴ Whelan, M.H.⁵

24
- 0022100963
- Y. Hirayama, Y. Suzuki, S. Tarucha, and H. Okamato, Jpn. J. Appl. Phys. 24, L516 (1986).
- (1986) Jpn. J. Appl. Phys. , vol.24
- Hirayama, Y.¹ Suzuki, Y.² Tarucha, S.³ Okamato, H.⁴

25
- 21544452320
- H. Cibert, P. M. Petroff, D. H. Werder, S. H. Pearton, A. C. Gossard, and H. H. English, Appl. Phys. Lett. 49, 223 (1986).
- (1986) Appl. Phys. Lett. , vol.49 , pp. 223
- Cibert, H.¹ Petroff, P.M.² Werder, D.H.³ Pearton, S.H.⁴ Gossard, A.C.⁵ English, H.H.⁶

26
- 0042842194
- K. B. Kahen and G. Rajeswaran, J. Appl. Phys. 66, 545 (1989).
- (1989) J. Appl. Phys. , vol.66 , pp. 545
- Kahen, K.B.¹ Rajeswaran, G.²

27
- 0038808654
- H. Leier, A. Forchel, G. Hörcher, J. Hommel, S. Bayer, H. Rothfritz, G. Weimann, and W. Schlapp, J. Appl. Phys. 67, 1805 (1990).
- (1990) J. Appl. Phys. , vol.67 , pp. 1805
- Leier, H.¹ Forchel, A.² Hörcher, G.³ Hommel, J.⁴ Bayer, S.⁵ Rothfritz, H.⁶ Weimann, G.⁷ Schlapp, W.⁸

28
- 0001387463
- P. Gavrilovic, D. G. Deppe, K. Meehan, N. Holonyak, Jr., J. J. Coleman, and R. D. Burnham, Appl. Phys. Lett. 47, 130 (1985).
- (1985) Appl. Phys. Lett. , vol.47 , pp. 130
- Gavrilovic, P.¹ Deppe, D.G.² Meehan, K.³ Holonyak Jr., N.⁴ Coleman, J.J.⁵ Burnham, R.D.⁶

29
- 0027640177
- J. Oshinowo, J. Dreybrodt, A. Forchel, N. Mestres, J. M. Calleja, I. Gyuro, P. Speier, and E. Zielinski, J. Appl. Phys. 74, 1983 (1993).
- (1993) J. Appl. Phys. , vol.74 , pp. 1983
- Oshinowo, J.¹ Dreybrodt, J.² Forchel, A.³ Mestres, N.⁴ Calleja, J.M.⁵ Gyuro, I.⁶ Speier, P.⁷ Zielinski, E.⁸

30
- 0028548110
- P. J. Poole, P. G. Piva, M. Buchanan, G. C. Aers, A. P. Roth, M. Dion, Z. R. Wasilewski, E. S. Koteles, S. Charbonneau, and J. Beauvais, Semicond. Sci. Technol. 9, 2134 (1994).
- (1994) Semicond. Sci. Technol. , vol.9 , pp. 2134
- Poole, P.J.¹ Piva, P.G.² Buchanan, M.³ Aers, G.C.⁴ Roth, A.P.⁵ Dion, M.⁶ Wasilewski, Z.R.⁷ Koteles, E.S.⁸ Charbonneau, S.⁹ Beauvais, J.¹⁰

31
- 0002694794
- D. G. Deppe and N. Holonyak, Jr., J. Appl. Phys. 64, R93 (1988).
- (1988) J. Appl. Phys. , vol.64
- Deppe, D.G.¹ Holonyak Jr., N.²

32
- 0003412161
- Pergamon, New York
- J. F. Ziegler, J. P. Biersack, and U. Littmark, The Stopping and Range of Ions in Solids (Pergamon, New York, 1985).
- (1985) The Stopping and Range of Ions in Solids
- Ziegler, J.F.¹ Biersack, J.P.² Littmark, U.³

33
- 5244268523
- J. F. Wagner, J. Appl. Phys. 69, 3023 (1991).
- (1991) J. Appl. Phys. , vol.69 , pp. 3023
- Wagner, J.F.¹

34
- 5244244951
- L. Wang, L. Hsu, E. E. Haller, J. W. Erickson, A. Fischer, K. Eberl, and M. Cardona, Phys. Rev. Lett. 76, 2343 (1996).
- (1996) Phys. Rev. Lett. , vol.76 , pp. 2343
- Wang, L.¹ Hsu, L.² Haller, E.E.³ Erickson, J.W.⁴ Fischer, A.⁵ Eberl, K.⁶ Cardona, M.⁷

35
- 0038270887
- B. L. Olmsted and S. N. Houde-Walter, Appl. Phys. Lett. 63, 530 (1993).
- (1993) Appl. Phys. Lett. , vol.63 , pp. 530
- Olmsted, B.L.¹ Houde-Walter, S.N.²

36
- 0016573564
- H. Matsumura and S. Furukawa, Jpn. J. Appl. Phys. 14, 1783 (1975).
- (1975) Jpn. J. Appl. Phys. , vol.14 , pp. 1783
- Matsumura, H.¹ Furukawa, S.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.