The refractive index of homogeneous SiO2 thin films

Optics and Spectroscopy (English translation of Optika i Spektroskopiya)

Volumn 105, Issue 3, 2008, Pages 461-465

  Mutilin, S V ^a   Khasanov, T ^b  

^a NOVOSIBIRSK STATE UNIVERSITY   (Russian Federation)

^b INSTITUTE OF SEMICONDUCTOR PHYSICS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL PROPERTIES; REFRACTIVE INDEX;

IN-HOMOGENEITY;

SILICON COMPOUNDS;

EID: 52349091744     PISSN: 0030400X     EISSN: 15626911     Source Type: Journal    
DOI: 10.1134/S0030400X0809018X     Document Type: Article

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