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Volumn 101, Issue 11, 2008, Pages

Tomographic femtosecond X-ray diffractive imaging

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; EXPERIMENTS; THERMOGRAPHY (TEMPERATURE MEASUREMENT);

EID: 52149114643     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.101.115507     Document Type: Article
Times cited : (36)

References (17)
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    • edited by P. Hawkes and J.C.H. Spence (Springer, Berlin
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    • (2007) Science of Microscopy
    • Spence, J.C.H.1
  • 7
    • 40849114658 scopus 로고    scopus 로고
    • JACGAR 0021-8898 10.1107/S0021889807067787
    • D. Smilgies, J. Appl. Crystallogr. JACGAR 0021-8898 41, 363 (2008). 10.1107/S0021889807067787
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    • Smilgies, D.1
  • 8
    • 34247620451 scopus 로고    scopus 로고
    • RSINAK 0034-6748 10.1063/1.2736942
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    • (2007) Rev. Sci. Instrum. , vol.78 , pp. 049901
    • Marchesini, S.1
  • 11
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    • (1964) Rev. Mod. Phys. , vol.36 , pp. 681
    • Batterman, B.W.1    Cole, H.2
  • 12
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    • (1975) Phys. Status Solidi A , vol.31 , pp. 583
    • Umeno, M.1    Hildebrandt, G.2
  • 16


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