In situ atomic force microscopy study of exfoliation phenomena on graphite basal planes

Electrochemistry Communications

Volumn 10, Issue 10, 2008, Pages 1590-1593

  Campana, F P ^a   Buqa, H ^a   Novak P ^a   Kotz R ^a   Siegenthaler, H ^b  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b UNIVERSITY OF BERN   (Switzerland)

Author keywords

Highly oriented pyrolytic graphite; In situ atomic force microscopy; Lithium intercalation; Organic electrolyte; Solid electrolyte interphase

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; CARBON; ELECTROLYSIS; ETHYLENE; GRAPHITE; LITHIUM; LITHIUM ALLOYS; LITHIUM COMPOUNDS; METALLIZING; MICROSCOPIC EXAMINATION; PROPYLENE; SCANNING PROBE MICROSCOPY; SULFATE MINERALS;

BASAL PLANES; BLISTER FORMATION; DEGRADATION PROCESSING; ETHYLENE CARBONATE; HIGHLY ORIENTED PYROLYTIC GRAPHITE; IN SITU ATOMIC FORCE MICROSCOPY; LITHIATION; LITHIUM INTERCALATION; LITHIUM-ION BATTERIES; MORPHOLOGY CHANGES; NEGATIVE ELECTRODES; ORGANIC ELECTROLYTE; PROPYLENE CARBONATE; SOLID ELECTROLYTE INTERPHASE;

IMAGING TECHNIQUES;

EID: 52149097553     PISSN: 13882481     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elecom.2008.08.026     Document Type: Article

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