Pressure-induced valence anomaly in TmTe probed by resonant inelastic X-ray scattering

Physical Review Letters

Volumn 101, Issue 12, 2008, Pages

  Jarrige, I ^a,i   Rueff, J P ^b,c   Shieh, S R ^d   Taguchi, M ^e   Ohishi, Y ^f   Matsumura, T ^g   Wang, C P ^h   Ishii, H ^a   Hiraoka, N ^a   Cai, Y Q ^a,j  

^a NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

^b SYNCHROTRON SOLEIL   (France)

^c SORBONNE UNIVERSITÉ   (France)

^d UNIVERSITY OF WESTERN ONTARIO   (Canada)

^e RIKEN SPring 8 Center   (Japan)

^f JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^g TOHOKU UNIVERSITY   (Japan)

^h NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

ⁱ JAPAN ATOMIC ENERGY AGENCY   (Japan)

^j BROOKHAVEN NATIONAL LABORATORY   (United States)

more..

Author keywords

[No Author keywords available]

Indexed keywords

RARE EARTH ELEMENTS; SCATTERING;

ANDERSON IMPURITY MODELS; D-HYBRIDIZATION; DELOCALIZATION; ELECTRON-DELOCALIZATION; F ELECTRONS; F SYSTEMS; KEY PARAMETERS; MIXED-VALENT; N -CHANNEL; RARE EARTHS; RESONANT INELASTIC X-RAY SCATTERING; SCREENING PROCESSES; SINGLE CHANNELS; VALENCE TRANSITIONS;

X RAY SCATTERING;

EID: 52149093849     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.101.127401     Document Type: Article

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