Determination of pressure-induced valence changes in YbAl2 by resonant inelastic x-ray emission

Physical Review B - Condensed Matter and Materials Physics

Volumn 68, Issue 24, 2003, Pages

  Dallera, C ^a   Annese, E ^b   Rueff, J P ^c   Palenzona, A ^d   Vanko G ^e   Braicovich, L ^a   Shukla, A ^e,g   Grioni, M ^f  

^a POLITECNICO DI MILANO   (Italy)

^b UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

^c Université Pierre et Marie Curie   (France)

^d UNIVERSITY OF GENOA   (Italy)

^e EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^f EPFL   (Switzerland)

^g UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM DERIVATIVE; YTTERBIUM;

ACCURACY; ANALYTICAL ERROR; ARTICLE; CHEMICAL STRUCTURE; ELECTRONICS; FLUORESCENCE; PRESSURE; X RAY ANALYSIS; X RAY SPECTROMETRY;

EID: 1042299897     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.68.245114     Document Type: Article

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