Decentralized diagnosis based on Boolean discrete event models: Application on manufacturing systems

International Journal of Production Research

Volumn 46, Issue 19, 2008, Pages 5469-5490

  Sayed Mouchaweh, M ^a   Philippot, A ^b   Carre Menetrier, V ^a  

^a UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

^b Ecole Normale Superieure de Cachan   (France)

Author keywords

Codiagnosability notion; Decentralized diagnosis; Diagnosability notion; Discrete event manufacturing systems; Fault diagnosis

Indexed keywords

SENSORS; TECHNOLOGY;

BOUNDED DELAY; CODIAGNOSABILITY NOTION; COMPUTATIONAL ENGINEERING; DECENTRALIZED DIAGNOSIS; DIAGNOSABILITY NOTION; DIAGNOSER; DIAGNOSERS; DISCRETE EVENT MANUFACTURING SYSTEMS; DISCRETE EVENTS; DISCRETE-EVENT MODELING; EVENT SEQUENCES; FAULT DIAGNOSIS; LIMITED COMMUNICATION; MANUFACTURING SYSTEMS; PARTIAL OBSERVATIONS; SENSORS AND ACTUATORS; SET OF RULES; TIME DELAYING;

MANUFACTURE;

EID: 52149083965     PISSN: 00207543     EISSN: 1366588X     Source Type: Journal    
DOI: 10.1080/00207540802367074     Document Type: Conference Paper

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